Fast Access Controller™Speed Flash Programming and Memory Testing with the Fast Access Controller™ The FAC is a patented plug-and-play IP solution for processor (Micro-controller, DSP or CPU), FPGA Users and ASIC/SoC designers who need to respond to customer demands for better Design-for-Test and improved support for programming external FLASH in a production environment. Intellitech's patented technology delivers the world's fastest on-board FLASH and non-volatile memory programming. There is no need to perform stand-alone or in-line device programming in order to achieve the optimum programming speeds. The FAC IP achieves its fast on-board FLASH programming times by using advanced data de-serialization and protocol optimization algorithms to minimize the number of scan operations and data required during FLASH programming. This enables the FAC to program FLASH devices in-system over the standard 1149.1 bus at speeds equivalent to off-board programming.
SystemBIST™Flexible FPGA configuration for Xilinx and Altera FPGAs with Security and PCB BIT (Built-in-Test) Capability SystemBIST™ is a complete plug-and-play IC for flexible FPGA configuration and embedded JTAG test built upon several unique patented architectures. SystemBIST™ is a code-less configuration device which enables design engineers to build high quality, self-testable and in-the-field re-configurable products. SystemBIST is vendor independent and can configure any IEEE 1532 or IEEE 1149.1 compliant FPGA. System CPLDs, EEPROMs and FLASH can also be re-programmed in the field with SystemBIST through other members of Intellitech's TEST-IP family. SystemBIST also provides the worlds first deterministic BIST (Built-In Self Test) for PCBs and entire systems. SystemBIST BIST removes much of the work required for a system level BIT (Built-In-Test) created with firmware/software. SystemBIST re-uses the manufacturing JTAG/IEEE 1149.1 based test patterns and scripts and embeds them in the PCB. The tests and FPGA configuration choices are stored compressed in FLASH memory enabling PCBs to be tested anywhere that they can be powered.
1149.1 Boundary Scan Test Development SoftwareIntellitech's Boundary Scan software is called the Eclipse Test Development Environment. The Eclipse™ Boundary Scan Test Development System is a Complete Solution for Test, Debug and In-System Configuration of Boundary Scan (IEEE 1149.1/JTAG) based PCB’s and Systems. The Eclipse TDE is part of a holistic solution that provides all the features that are required to test ‘real world’ printed circuit boards. This includes important essential capabilities such as
- boundary scan 1149.1 IC to IC interconnect testing
- Memory interconnect testing
- On-board FLASH programming
- In-system programming for FPGAs
- CPLD programming
- Schematic based debugging
- Robust pin level diagnostics
- open-source JTAG scan scripting
- LabView JTAG VIs and built-in PXI/VXI/GPIB instrument support
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PT100 - Concurrent Boundary Scan (CJTAG) for Burn-in or ProductionPT100 Parallel Tester - Industry's highest throughput digital test and configuration testerThe PT100 Parallel Tester enables high throughput PCB digital test, on-board FLASH and CPLD programming while keeping up with modern production line rates of one PCB every 20 to 40 seconds. The PT100 is a key element in any modern CM or EMS manufacturing line. As test time and in-system configuration times continue to increase, the PT100 can keep up with the fastest production line without sacrificing on product test quality or resorting to pre-programming non-volatile parts. The PT100 Parallel Tester is designed to off-load in-circuit testers and in-line programmers and optimize throughput of digital test and configuration of PCBs incorporating the IEEE 1149.1 standard. It is ideal for testing large FPGA based PCBs with moderate to large amounts of FLASH memory or panelized PCBs with 8, 16, 32 or more circuits per panel.
JAF Pro - Production PCB Combinational TesterThe JAF Pro combines ARM Functional Test, Analog Test and Boundary Scan in one platform for testing up to 32 PCBs at a time. The JAF Pro solves the test challenges and cost requirements of testing small, high-volume PCBs used in the home, mobile, entertainment, automotive and embedded markets. PCBs in these markets are cost sensitive yet require high volume, high fault coverage on leading edge technologies such as WiFi, DDR Memory, USB, Bluetooth, Nand Flash, MPEG decoders, Power Management Units, and MMC/Smart Cards interfaces. Miniaturization makes traditional test point access to both digital and analog nets difficult or impossible. The JAF Pro is targeted for small, low power PCBs that have one or more ARM® based processors. ARM based processors make up about 75% of all 32 bit processors sold and exist in 95% of all cell phones. The manufacturing volumes in this category of PCBs prohibit single boundary-scan or single emulation controller approaches to test.
Develop - Simulate - Validate JTAG/IJTAG Silicon Instruments using NEBULAYou can register here to download NEBULA 6.11. This is not a trial software or an evaluation, it is free to use.
Test Development and Engineering ServicesIntellitech has a very experienced consulting and test development organization that is dedicated to provide our customers with high-quality design and test services. Intellitech consulting engineers will assist you in Design-for-Test implementation, production test solution, BSDL Verification, Test program development and manufacturing test deployment. Intellitech engineers have a wide industry experience in telecommunications, aerospace, consumer products, automotive and blade servers and can offer you expertise in the industry's best practices at the lowest cost.